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 ASAHI KASEI
[AK2573A]
AK2573A
125M / 156M Laser Diode Driver + APC
Features - 1 chip 125M / 156M Laser Diode Driver (LDD) + Digital APC (APC_FF and APC_FB) - Programmable laser BIAS and modulation current controlled by an on-chip temperature sensor (APC_FF) - Digital feedback circuit for APC (APC FB) - Two current output 8 bit DACs, I-DAC1: 85mA sink for modulation current I-DAC2: 54mA sink for BIAS current - TXFAULT detection and 1kbit ID Field (EEPROM) for SFP (Small Form-factor Pluggable) support - I2CTM compatible digital I/F - Duty adjustment - Power failure alarm (OPTALM), Over current alarm (CURRALM), Temperature alarm (TEMPALM), Data alarm (DATAALM) and TXFAULT for failure alarm - BIAS and modulation current monitors (* 0.0095) - Single 3.3V +/- 0.2V operation Applications STM-1 / OC-3 (156Mbps) Optical Interface Module TS-1000 (125Mbps) Optical Interface Module Description The AK2573A is a 1chip LDD (Laser Diode Driver) and an APC (Auto Power Control) for laser direct modulation application. It contains up to 156M LDD, programmable duty adjustment, BIAS and modulation currents, a digital feedback circuit, BIAS and modulation current monitors, failure alarms, I2CTM interface, an EEPROM for storing LD characteristics and user information, and TXFAULT detection for SFP application. The AK2573A has two APC functions; APC FF (Feed-forward) and APC FB (Feedback). APC FF supplies a programmed current in response to the temperature. APC FB provides a stable auto power control function with an internal digital feedback algorithm. All program and operational functions can be set through the I2CTM compatible interface and stored in the on-chip EEPROM. Ordering Information Product Number AK2573AVB Block Diagram
SEL DATAP DATAN DATA (LVPECL) Selecter DUTY_ ADJ DRIVER
PKG BCC++ 48 (7mm * 7mm)
I2CTM is a trademark o f Philips Corporation.
IMODN LD IMOD Imod
CLKP CLKN
CLK (LVPECL)
FF
OSC I-DAC1
* 0.0095
MODMON
TEMPSENS
ADC
EEPROM
APC I-DAC2
Ibias IBIAS
* 0.0095
TEMPMON
BIASMON DATAALM OPTALM ALM PDGAIN RPD CPD BIAS RB (12k) SCL SDA* WP** BIAS_GEN PDIN CURRALM TEMPALM TXFAULT* Digital I/F
Monitor PD
PDMON
SHUTDOWN CONTROL
TXDIS1 TXDIS2 *: Open Drain **: Pull-up

-1-
2004/5
ASAHI KASEI - Contents -
[AK2573A]
. Pin Description 4 . Absolute Maximum Rating 6 . Recommend Operation Conditions 6 . Electrical Cghracteristics 6 1. Power Consumption 6 2. EEPROM 6 3. Digital Input / Output DC Characteristics 7 4. I2CTM I/F AC Character 7 5. LVPECL I/F 7 6. I-DAC1 8 7. I-DAC2 8 8. Duty Cycle Adjustment 8 9. Current Monitor 8 10. PDGAIN 9 11. DACAPC 9 12. BIASGEN 9 13. Temperature Sensor 9 14. ADC 9 15. Power On Reset 9 16. On-chip Oscillator 9 17. OPTALM Detect Level 9 18. TXDIS Release Time 9 . Package Information 10 . Circuit Description 11 1. Parameter Nortation 11 1.1 Parameter Definition 11 1.2 Operation Overview 11 2. Driver 12 3. DATA/CLK I/F (LVPECL) 12 3.1 LVPECL Input (DATAP/DATAN/CLKP/CLKN) 13 3.2 Duty Adjustment 14 4. APC 14 4.1 APC_FF Function 15 4.2 APC_FB Function 15 4.2.1 PDGAIN 16 4.2.2 DACAPC 16 4.2.3 Example of APC Setting 16 4.3 Temperature Sensor (TEMPSENS) 20 4.4 Current Monitor 21 5. Alarm 22 5.1 OPTALM 22 5.2 CURRALM 22 5.3 TEMPALM 22 5.4 DATAALM 22 5.5 TXFAULT 22 6. Shutdown 23 6.1 Shutdown Operation 23 -22004/5
ASAHI KASEI
[AK2573A]
6.2 Temperature Compensation between Shutdown Request and Release 23 7. Power-up/down Timing 24 7.1 Delay Time of TXFAULT Detection with OPTALM 24 7.2 Power on Initialization Procedure without Shutdown Request (TXDIS=L) 25 7.3 Power on Initialization Procedure with Shutdown Request (TXDIS=H) 25 7.4 TXDIS Timing during Normal Operation 26 7.5 TXFAULT Detection / Reset with Recovery 26 7.6 TXFAULT Detection / Reset without Recovery 27 8. I2CTM I/F 28 8.1 Memory Map 28 8.2 Read / Write Operation 29 8.2.1 Byte Write 29 8.2.2 Page Write 29 8.2.3 Current Address Read 29 8.2.4 Random Read 29 8.2.5 Sequential Read 29 8.2.6 Data Change 30 8.2.7 Start / Stop Condition 30 8.3 EEPROM 31 8.4 Register 33 9. Operation Mode 35 9.1 Self-running Mode 35 9.2 Adjustment Mode 35 9.3 EEPROM Mode 35 9.4 MODE Control 35 9.5 Operation Mode Protection 35 10. Module Adjustment Example 36 . Circuit Example 37

-3-
2004/5
ASAHI KASEI
[AK2573A]
. Pin Description The symbol of I/O row shows below. Ai: Analog input, Ai_l: LVPECL input, Ao: Analog output Di: Digital input, Di_pu: Digital input with pulled-up resistor, Do: Digital output, Dio: Digital input / output, Do_od: Digital output (open drain), Dio_od: Didital input / output (open drain) PWR: Power or VSS PIN# 1 2 3 4 5 6 7 Symbol NC DATAP DATAN SEL CLKP CLKN WP Function No Connection. Connect to the VSS or leave open. Positive LVPECL data input. Input Inpedance >= 10k Negative LVPECL data input. Input Indedance >= 10k "H" for latched data with clock. "L" for direct data. Positive LVPECL clock input. Connect to VSS when SEL ="L". Negative LVPECL clock input. Connect to VDD or leave open when SEL = "L". Write Protect. Internally pulled-up with 20k (typ). "H" sets device address 101000 and only user area of EEPROM can access as read-only. "L" sets device address as 1010 and full of EEPROM can access as read/write. For more information, see Table 8-2 and 9-1. TX Disable. "H" for disable MOD and BIAS current. TXDIS1 and TXDIS2 are ORed internally. Use 4.7k or more for externally pulled-up or pulled-down. Power supply for digital circuit. TX Fault detection output (Open drain). Connect to VDD with 4.7k to 10k resistor. Set "H" when detect TEMPALM, CURRALM, OPTALM or DATAALM. When set RE_SFP=1 and detect the ALM, TXFAULT is kept "H" until receiving disable request at TXDIS1 or TXDIS2. No Connection. Connect to the VSS or leave open. Serial data input / output (Open drain). Connect to VDD with 4.7k to 10k resistor. I/O Ai_l Ai_l Di Ai_l Ai_l Di_pu Remark
Do not leave open
8 9 10 11
TXDIS1 TXDIS2 DVDD TXFAULT
Di
Do not leave open
PWR Do_od
AC load 100pF
12 13
NC SDA
Dio_od
14 15 16 17 18 19
SCL DVSS NC DATAALM OPTALM CURRALM
Serial clock input. The data (SDA) is shifted in at the rising edge of SCL and is shifted out at the falling edge of SCL. VSS for digital circuit. No Connection. Connect to the VSS or leave open. Sets the alarm when detects 1's or 0's sequential data input. The detection time is 4.5us (typ). The polarity can be set with EEPROM. Sets the alarm when detects monitor PD current drop. The polarity can be set with EEPROM. Sets the alarm when detects the over current of I-DAC1 or I-DAC2. Alarm level can be set every 6. The polarity can be set with EEPROM.
Di PWR Do Do Do
AC Load 100pF Do not leave open Do not leave open
AC Load 30pF AC Load 30pF AC Load 30pF

-4-
2004/5
ASAHI KASEI Pin Description (Continued) PIN# Symbol Function 20 TEMPALM Sets the alarm when detects the over temperature. The polarity can be set with EEPROM. 21 TEMPMON Temperature sensor monitor output.
[AK2573A]
I/O Do Ao
Remark AC Load 30pF AC load 30pF DC load 50k
22 23
BIAS PDMON
BIAS reference for internal circuit. Connect to VSS with 12k +/- Ao 1% resistor. PDIN regulated output. Adjust PDGAIN to PDMON = 1V Ao (typ).
AC load 30pF DC load 50k
24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48
AVSS AVDD PDIN VSSBI IBIAS VSSBI VSSMD IMOD
IMODN VSSMD VDDMD NC VDDDR VSSDR BIASMON MODMON TEST1 TEST2 TEST3 TEST4 TEST5 TEST6
VSS for analog circuit. Power supply for analog circuit. Connect to the power supply through R-C LPF (R=10, C=1uF is recommended). Monitor PD voltage input. Monitor PD current is converted to the voltage with resistor and capacitor that has 1kHz to 10kHz cut-off frequency. VSS for BIAS current drive circuit. BIAS current output. Sinks up to 54mA (typ) current. BIAS current is adjusted with I-DAC2. IBIAS voltage should be (VDD - 1.8V) or more. VSS for BIAS current drive circuit. VSS for MOD current drive circuit. Positive MOD current output. Sinks up to 85mA (typ) MOD current when input data is "H". MOD current is adjusted with I-DAC1. IMOD voltage should be (VDD - 1.8V) or more. Negative MOD current output. Sinks MOD current when input data is "L". VSS for MOD current drive circuit. Power supply for MOD current circuit. No Connection. Connect to the VSS or leave open Power supply for MOD driver circuit. VSS for MOD driver circuit. BIAS monitor current output. Sources 0.0095 times current of I-DAC2 (BIAS) current. BIASMON voltage should be 1.3V or less. MOD Monitor current output. Sources 0.0095 times current of I-DAC1 (modulation) current. BIASMON voltage should be 1.3V or less. Test input. Connect to VSS for normal operation Test input. Connect to VSS for normal operation Test input. Connect to VSS for normal operation Test input. Connect to VSS for normal operation Test input. Connect to VSS for normal operation Test input. Leave open for normal operation.
PWR PWR Ai PWR Ao PWR PWR Ao
Ao PWR PWR PWR PWR Ao Ao Di Di Di Di Di Do Connect to VSS.
Leave open
Center PAD of PKG should be connected to the VSS for good electrical performance and radiation of heat.

-5-
2004/5
ASAHI KASEI . Absolute Maximum Rating Item Symbol Min Max Unit Supply Voltage VDD -0.3 6.0 V GND VSS 0.0 0.0 V Input voltage VIN -0.3 VDD + 0.3 V Input Current IIN -10 10 mA Storage Temperature TSTG -55 130 C Stress beyond "Absolute Maximum Range" may cause permanent damage to the device. Note 1: Except Data retention. Data retention is prescribed at section- (2) EEPROM. . Recommended Operation Conditions Item Operating Ambient Power Supply Symbol Ta1 VDD1 VDD2 VSS Min -40 3.1 3.0 0.0 Typ 3.3 3.3 0.0 Max 85 3.5 3.5 0.0 Unit C V V V
[AK2573A]
Remarks Reference Voltage Except VDD Except VDD Note 1
Remarks Except AVDD AVDD ReferenceVoltage
. Electrical Characteristics 1. Power Consumption Item Symbol min typ max Unit Remarks Supply Current 1 (All VDD) IDD1 7.8 9.4 mA Note 1, 2, 3 Supply Current 2 (All VDD) IDD2 15 20 mA Note 1, 2, 4 Supply Current 3 (AVDD only) IDD3 5 mA Note 1, 5 Note 1: without BIAS and modulation current Note 2: I-DAC1 = 0, I-DAC2 = 0, Gain = 1, PDGAIN = 0dB, PDIN = 1V Note 3: DATAP = CLKP = "L", DATAN =CLKN = "H" Note 4: 155.52Mbps, PN7 Note 5: I-DAC1 = I-DAC2 = FFh (Full code), Gain = 1, PDGAIN = 0dB, PDIN = 1V 2. EEPROM Item Endurance Data retention
min 10000 10
max -
Unit Remarks Write Cycle Note 1 Year Junction Temperature = 85
Note 1: This parameter is characterized and is not 100% tested. Important Notice: The AKM factory adjusted data are stored in advance at address location (Device Address = A6h, Address = 60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to the AK2573A which exceeds a guaranteed EEPROM data retention conditions (for 10 years at 85C), it is important to read the pre-determined value in advamce and to re-write the same data back into EEPROM after an exposure to the excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to re-write it after the test. Access to un-used address locations is not functionally guaranteed. Refer to section- 8.3 for EEPROM map.

-6-
2004/5
ASAHI KASEI 3. Digital Input / Output DC Characteristics Item Symbol min Input High Level VIH 2.0 Input Low Level VIL Output High Level VOH 0.9VDD Output Low Level VOL Input Leakage Current 1 IL1 Input Leakage Current 2 IL2 Note 1: except DATAP, DATAN, CLKP and CLKN pins. Note 2: SDA and TXFAULT pins Note 3: except SDA and TXFAULT pins 4.
[AK2573A]
max 0.8 0.4 10 350
Unit V V V V uA uA
Conditions Note 1 IOH = -0.2mA IOL = 1mA (Note 2) IOL = 0.2mA (Note 3) except WP pin WP pin
I2CTM I/F AC Characteristics Symbol Parameter min tSCL Clock Frequency, SCL tLOW Clock Pulse Width Low 4.7 thigh Clock Pulse Width High 4.0 tI Noise Suppression Time tAA Clock Low to Data Out Valid 0.1 tBUF Time Before a New Transmission 4.7 tHD.STA Start Hold Time 4.7 tSU.STA Start Setup Time 4.0 tHD.DAT Data Hold Time 0 tSU.DAT Data Setup Time 200 tR Input Rise Time tF Input Fall Time tSU.STO Stop Setup Time 4.7 tDH SDATA Hold Time 100 tWR Write Cycle Time Note 1: This parameter is characterized and is not 100% tested.
tF tR SCL tSU.STA tHD.STA tHD.DAT tSU.DAT tSU.STO
max 100
100 4.5
1.0 0.3
10
Unit kHz us us ns us us us us us ns us us us ns ms
Remark
Note 1 Note 1
SDA (IN) tBUF tAA tDH
SDA (OUT)
5. LVPECL I/F Item Symbol min typ Single-ended Input Voltage Swing Vamp 0.1 Common Voltage Vcom 0.5*VDD BIAS Voltage Vbias 0.6*VDD Input Impedance Zin 10 Set-up Time tsu 1.5 Hold Time th 1.5 Note 1: This parameter is characterized and is not 100% tested.
max 1.2 VDD - 1.0
Unit V V V k ns ns
Remarks
SEL="H" Note 1

-7-
2004/5
ASAHI KASEI
[AK2573A]
Vamp Vcom CLKP/CLKN DATAP/DATAN CLK (CLKP - CLKN) DATA (DATAP - DATAN) tsu th
6. I-DAC1 Item Resolution Output Current with Full Code 1 Output Current with Full Code 2 Current Supply with Shutdown 1 LSB Current Step 1 1 LSB Current Step 2 DNL 7. I-DAC2 Item Resolution Output Current with Full Code 1 Output Current with Full Code 2 Current Supply with Shutdown 1 LSB Current Step 1 1 LSB Current Step 2 DNL
Condition IMOD = 1.3V IMOD = 1.3V IMOD = VDD IMOD = 1.3V IMOD = 1.3V IMOD = 1.3V
min 76 38
typ 8 85 43
max 94 50 100
Unit Remark bit mA RE_DAC1_GAIN = 1 mA uA RE_DAC1_GAIN = 0 TXDISx = "H"
0.333 0.169 -1 +1
mA RE_DAC1_GAIN = 1 mA RE_DAC1_GAIN = 0 LSB Code 20h to FFh
Condition IMOD = 1.3V IMOD = 1.3V IMOD = VDD IMOD = 1.3V IMOD = 1.3V IMOD = 1.3V
min 48 24
typ 8 54 27
max 60 30 100
Unit Remark bit mA RE_DAC2_GAIN = 1 mA uA RE_DAC2_GAIN = 0 TXDISx = "H"
0.212 0.106 -1 +1
mA RE_DAC2_GAIN = 1 mA RE_DAC2_GAIN = 0 LSB Code 20h to FFh
8. Duty Cycle Adjustment Item Maximum Pulse Extended 1 LSB Pulse Extended Step Pulse Extended Stability
min 0.5
typ 0.03
max
0.2
Unit ns ns ns
Remarks Note 1 32 Steps Ta=-40 to 85, VDDDR=3.13.5V, 0.3ns Extended (Note 1)
Note 1: This parameter is characterized and is not 100% tested. 9. Current Monitor Item Condition MODMON to MODMON = 1.3V I-DAC1 Gain Full Code BIASMON to BIASMON = 1.3V I-DAC2 Gain Full Code
min 0.008 0.008
typ 0.0095 0.0095
max 0.011 0.011
Unit A/A A/A
Remark

-8-
2004/5
ASAHI KASEI 10. PDGAIN Item PDIN Input Range PDGAIN Gain Error 11. DACAPC Item Maximum Output Voltage Minimum Output Voltage DNL 12. BIASGEN Item BIAS pin Voltage
[AK2573A]
PDMON=1V10% PDINPDMON
min 0.08 -0.5
typ
max 2.5 +0.5
Unit V dB
Remark
Condition Test Mode Test Mode Test Mode
min 1.135 0.752 -1
typ 1.195 0.792
max 1.255 0.832 +1
Unit V LSB
Remark
Condition
min
typ 1.2
max
Unit V
Remark
13. Temperature Sensor Item Condition min Voltage Slope TEMPMON Voltage -12.14 Offset Adjustment Target Ta = 35 Note 1: This parameter is characterized and is not 100% tested. 14. ADC Item Resolution Maximum Input Voltage Minimum Input Voltage DNL 15. Power On Reset Item Detect Voltage
typ -11.56 1.215
max -10.98
Unit mV / V
Remark Note-1
Condition
min 2.09 -1/2
typ 7 2.2 0
max 2.31 +1/2
Unit bit V V LSB
Remark
Condition
min 2.3
typ 2.5
max 2.7
Unit V
Remark
16. On-chip Oscillator Item Condition Clock Frequency Test Mode
min
typ 2.15
max
Unit MHz
Remark
17. OPTALM Detect Level Condition OPTALM Detect Level 1/3 Setting, PDGAIN=0dB 1/4 Setting, PDGAIN=0dB 1/6 Setting, PDGAIN=0dB 1/7 Setting, PDGAIN=0dB
min 1/3.2 1/4.3 1/6.4 1/7.5
typ 1/3 1/4 1/6 1/7
max 1/2.8 1/3.7 1/5.6 1/6.5
Unit
Remark
18. TXDIS Release Time Item Condition min typ TXDIS Release Time Note 1: This parameter is characterized and is not 100% tested.
max 500
Unit us
Remark Note 1

-9-
2004/5
ASAHI KASEI . Package Information (1) Package Type: 48 pin BCC++ (2) Marking Information: (a) PIN#1 Indication: (b) Logo: AKM (c) Marking Code: AK2573AVB (d) Date Code: YYWWXXX (7 digit)
[AK2573A]
AKM AK2573AVB YYWWXXX
(3) Package Outline
6.2 7.00.1 37 25 0.5 0.50.1 25 37
0.09MIN
5.1 5.50.06 7.00.1 6.15
"B" 0.450.06 0.450.06
6.2
"A"
1
13
"C"
13 5.0 6.15
1
"A" Part
"B" Part 0.40.06 0.450.06
"C" Part
0.80 MAX
0.05
0.0750.025
0.14 MIN
C0.2
0.30.06
0.450.06

-10-
5.0
2004/5
ASAHI KASEI . Circuit Description
[AK2573A]
1. Parameter Notation 1.1 Parameter Definition In the AK2573A Circuit Description, in order to distinguish various pre-set parameter sources from EEPROM, Registers or Device pins, "Identifier - Main name" notation is used as shown in Table 1-1. For ease of operational description, small letters sometimes expresses internal signals. Table 1-1 Parameter Definitions Identifier Register R_ EEPROM Ether or both Register or /and EEPROM PIN BLOCK Internal Node E_ RE_ P_ None None Main Name REGISTER name (All Capital) EEPROM name (All Capital)) REGISTER / EEPROM name (All Capital) PIN name (All Capital) BLOCK name (All Capital)) signal name (small letter) Example R_APC_FB R_DAC1 Indicates EEPROM E_PDGAIN E_DAC1_FF_TC Indicates either register RE_DAC1_GAIN or EEPROM RE_APC_TRGT P_PDMON I-DAC1 APC_COMP vpd Remark Indicates register
1.2 Operation Overview The AK2573A has 3 primary functions; 125M / 156M Laser diode driver part, APC (Automatic Power Control) part which supplies adequate bias current and modulation current to a Laser Diode, and the Control part to control operation modes of the AK2573A operation. There are 3 operation modes in the AK2573A. Since each adjusting function is controlled through I2CTM Interface, it realizes an automatic parameter adjustment. (1) Self-running Mode Self-running mode is ready for normal operation after all adjustments are completed. In this mode, temperature detection, EEPROM access and feeding current are automatically performed using the on-chip oscillator. The AK2573A works in this mode after power-on. (2) Adjustment Mode Adjustment mode is designed for training the LD characteristics. The AK2573A operates according to the register settings set through the I2CTM I/F. (3) EEPROM Mode EEPROM mode is used for storing LD characteristics in EEPROM via I2CTM I/F. to

-11-
2004/5
ASAHI KASEI
[AK2573A]
2. Driver Fig 2-1 illustrates the block diagram of the driver function. AK2573A has two current DACs, I-DAC1 and I-DAC2. I-DAC1 is for modulation current and I-DAC2 is for bias current. Table 1-1 and 1-2 show I-DAC1, I-DAC2 characteristics. Fig 2-1 Driver Block Diagram
LD
IBIAS AK2573A I-DAC2 Ibias
IMOD
IMODN
Driver Imod I-DAC1
(1) I-DAC1 (Table 2-1) RE_DAC1_ GAIN 1 0 (2) I-DAC2 (Table 2-2) RE_DAC2_ GAIN 1 0
DAC1_GAIN 1 1/2
Output current @ Output Current Current step / Full code (typ) Range (typ) LSB (typ) 85 mA 0 to 85 mA 0.333 mA 43 mA 0 to 43 mA 0.169 mA
DAC2_GAIN 1 1/2
Output current @ Output Current Current step / Full code (typ) Range (typ) LSB (typ) 54 mA 0 to 54 mA 0.212 mA 27 mA 0 to 27 mA 0.106 mA
(3) I-DAC1 / I-DAC2 Common Characteristics Resolution: 8bit DNL: +/- 1 LSB @ code = 20h to FFh 3. DATA / CLK I/F (LVPECL) The AK2573A supports direct data or latched data input (see Table 3-1). Connect CLKP = VSS, and connect CLKN = VDD or leave open when SEL ="L". Table 3-1 Data input SEL (CMOS) "L" "H"
Direct data Latched data with clock

-12-
2004/5
ASAHI KASEI
[AK2573A]
3.1 LVPECL Input (DATAP / DATAN / CLKP / CLKN) Table 3-2 shows LVPECL input characteristics. The AK2573A LVPECL input, which is biased to 0.6 * VDD with 10k or more inpedance respectively, supports both AC and DC coupling. Fig 3-2 illustrates LVPECL input with AC coupling and Fig3-3 illustrates with DC coupling respectively. Table 3-2 LVPEL Interface characteristics Item Symbol min typ Single-ended Input Voltage |Vamp| 0.1 Swing Common Voltage Vcom 0.5*VDD BIAS Voltage Vbias 0.6*VDD Input Impedance Zin 10 Set-up Time tsu 1.5 Hold Time th 1.5 Note 1: This parameter is characterized and is not 100% tested. Fig 3-1 DATA / CLK Input Level
Vamp Vcom CLKP/CLKN DATAP/DATAN
max 1.2 VDD - 1.0
Unit V V V k ns ns
Remarks see Fig 3-1
see Fig 3-2 and 3-3 see Fig 3-4 Note 1
Fig 3-2 LVPECL input with AC coupling
AK2573A Vbias
Fig3-3 LVPECL input with DC coupling
AK2573A
0.01uF or more
Zin
130
Zin
100
DATAP CLKP Zin DATAN CLKN
82
DATAP DATAN CLKP CLKN
Vbias
0.01uF or more
Vbias
Fig 3-4 Set-up & Hold Time
DATA (DATAP DATAN) tsu CLK (CLKP - CLKN) th

-13-
2004/5
ASAHI KASEI
[AK2573A]
3.2 Duty Adjustment AK2573A supplies a programmed duty adjustment in response to the temperature from an on-chip temperature sensor (every 6, Duty data is stored in E_DUTY_TC, see Table 8-3 for more information). Write same data into E_DUTY_TC for constant duty adjustment. Table 3-3 and 3-4 show the characteristics of duty adjustment function. Table 3-3 Duty Adjustment characteristics Item Symbol min Maximum Pulse Extended Td 0.5 1 LSB Pulse Extended Step Tstep Pulse Extended Stability Tsta typ 0.03 0.2 max Unit ns ns ns Remarks Note 1 32 Steps Ta=-40 to 85, VDD=3.1 3.5V, 0.3ns Extended (Note 1)
Note 1: This parameter is characterized and is not 100% tested. Table 3-4 Pulse Extended R_DUTY Pulse Extended (typ) [ns] 0 0 1 0.03 2 0.06 . . . . 30 0.90 31 0.93
Remark
4. APC The AK2573A has two APC functions, APC FF (Feed-forward) and APC FB (Feedback). APC FF supplies a programmed current in response to the temperature from an on-chip temperature sensor. APC_FB provides stable a power control function using a digital feedback algorithm. The APC_FF and APC_FB is user programmable. Fig4-1 illustrates APC block diagram. Fig 4-1 APC Block Diagram
ALM Polarity (RE_ALM_POL) Temperature ALM (RE_TEMPALM) TEMP ALM Gain (RE_DAC1_GAIN) APC FF (R_DAC1_FF) TEMPSN S ADC R_TEMP EEPROM K_DAC1 _FBRT APC FB Operation (RE_APC_FB_SET) TEMPMON APC Operation (RE_APC_FF_SET) K_DAC2 _FBRT + R_DAC2 * 0.0095 APC Feedback (R_APC_FB) ALMPolarity (RE_ALM_POL) R_DAC1 R_DAC2 Over current ALM (RE_CURRALM) ALM Polarity (RE_ALM_POL) OPTALM OPTALM Reference (optalm_ref) OPTALM BIASMON R_DAC1 Imod I-DAC1 Driver IMODN I-DAC1 FB (R_DAC1_FB) I-DAC2 FB (R_DAC2_FB) * 0.0095 MODMO Gain N (RE_DAC2_GAIN) Ibias IBIAS APC FF (R_DAC2_FF) I-DAC2 TEMPALM
RE_TEMP_OFFSET
IMOD
+
APC FB Initial setting (RE_APC_INIT_SET) PDMON
Monitor PD PDIN CPD RPD
PDGAIN (RE_PDGAIN) APC_ COMP
Digital Filter apc_comp_out vpd 1/N 1/s
CURR ALM
CURRALM
PDGAIN
OPTALM (RE_OPTALM_)
APC Target (RE_APC_TRGT)
DAC_APC
vapc_ref
ATT

-14-
2004/5
ASAHI KASEI
[AK2573A]
4.1 APC_FF Function Fig 4-2 illustrates the APC FF functions. The operation is as follows: (1) Analog to digital conversion of the voltage (7 bit) that reflects the temperature for every temperature detection period (128ms typ). (2) Read the 8 bit current data (address is indicated by the ADC data) from EEPROM and set this value to the I-DACs. If the current data over temperature is set to each EEPROM address, the compensated current is supplied to the LD automatically. To use this function, current data should be stored in EEPROM in advance. The temperature sensor is cover-40 to 115 and EEPROM is prepared with 1.5 steps. Fig 4-2 APC FF function
ADC (7bit) Addressing with R_TEMP R_TEMP EEPROM R_DAC1_FF
TEMPSENS
I-DAC1
Driver MOD Current LD
TEMPSENS charatcteristics Voltage
Address
Data R_DAC2_FF
I-DAC2 BIAS Current
Memory for I-DAC1 Temperature
Memory for I-DAC2
4.2 APC_FB Function Fig 4-3 shows APC_FB functions. It operates as follows: (1) APC_COMP compares vpd and vapc_ref. (2) The digital filter calculates the compensation current (R_APC_FB) to equalize vpd with vapc_ref to keep LD power constant. The vapc_ref (RE_APC_TRGT) can be changed over temperature automatically. Temperature compensation procedure is as same as APC FF (data of DAC_APC is read out EEPROM in response to the temperature). For the stable operation, the cut-off frequency of RPD and CPD should be 1kHz to 10kHz. Fig 4-3 APC FB function
TEMPSENS ADC R_TEMP EEPROM may set initial valuein response to the temperature at power-on to accelerate power-up sequence Monitor PD PDMON PDIN CPD PDGAIN RPD vpd APC_ COMP comp_out 1/N 1/s APC FF + R_DACx I-DAC
512kHz(typ)
Digital Filter R_APC_FB
Electrical volume for Monitor PD
RE_APC_TRGT
DAC_APC
vapc_ref

-15-
2004/5
ASAHI KASEI
[AK2573A]
4.2.1 PDGAIN PD monitor current is converted to the average voltage with RPD and CPD and input to PDIN. PDIN voltage may be gained at PDGAIN and monitored at PDMON. PDGAIN should be adjusted to PDMON = 1V typ. The gain range of PDGAIN is -8.0dB to 23.5dB with 0.5dB steps (6-bits). PDGAIN is set via the I2CTM interface. Table 4-1 shows PDIN input range and Table 4-2 shows the relationship between PDGAIN and EEPROM setting. Table 4-1 PDIN input range Parameter PDIN Input range Table 4-2 PDGAIN RE_PDGAIN_SET 000000 (0) 000001 (1) : 111110 (62) 111111 (63) min 0.08V max 2.5V Remark
Gain (typ) [dB] 23.5 23.0 : -7.5 -8.0
Remark 0.5dB step
4.2.2 DACAPC DACAPC generates the reference voltage of APC (vapc_ref). AK2573A supplies a programmed APC reference in response to the temperature from an on-chip temperature sensor (every 6, APC reference data is stored in E_APC_TRGT_TC, see Table 8-3 for more information). Write same data into E_APC_TRGT_TC for constant APC reference. Table 4-3 shows the relationship between APC reference voltage (vapc_ref) and EEPROM setting. Table 4-3 DACAPC E_APC_TRGT_TC (R_APC_TRGT) 00000(0) : 01111 (15) 10000 (16) 10001 (17) : 11111 (31) DACAPC (vapc_ref) (typ) [V] 0.792 0.987 1.0 1.013 1.195 Remark 13mV step
4.2.3 Example of APC Setting Table 4-4 shows the typical setting of APC function (APC_FF and APC_FB). The combination of APC is set by RE_APC_FF and RE_APC_FB. Fig 4-5 shows the EEPROM area for MOD current (E_DAC1_TC) and BIAS current (E_DAC2_TC). The data should be stored in E_DAC1_TC and E_DAC2_TC is determined by RE_APC_FF and RE_APC_FB. Table 4-7 and 4-8 shows all combination of APC function. RE_APC_FF is 2bit data to be assigned I-DAC for APC_FF operation. MSB is for I-DAC2 and LSB for I-DAC1. RE_APC_FB is 2bit data to be assigned I-DAC for APC_FB operation. MSB is for I-DAC2 and LSB for I-DAC1. In the case of RE_APC_FB=11(binary), AK2573A is in "Dual Feedback" (see Fig 4-9, 4-10 and Table 4-6).

-16-
2004/5
ASAHI KASEI
[AK2573A]
Table 4-4 Example of APC FF and APC FB combination RE_APC_ RE_APC_ BIAS MOD Remarks Reference FF_SET FB_SET (I-DAC2) (I-DAC1) 01 10 FB FF The initial value of APC FB according to the Fig 4-4 temperature can be set to accelerate power up time. 10 01 FF FB The initial value of APC FB according to the Fig 4-5 temperature can be set to accelerate power up time. 11 00 FF FF Both BIAS and MOD current are detrmined by Fig 4-6 APC_FF. APC_FB is not work. 11 01 FF FF+FB Both BIAS and MOD current are detrmined by Fig 4-7 APC_FF. APC_FB is set to MOD for LD aging. 11 10 FF+FB FF Both BIAS and MOD current are detrmined by Fig 4-8 APC_FF. APC_FB is set to BIAS for LD aging. 01 11 FB FF+FB Dual Feedback function. Fig 4-9 BIAS current is determined by APC_FB. MOD current is determined by APC_FF and APC_FB. The initial value of APC_FB according to the temperature can be set to accelerate power up time. 10 11 FF+FB FB Dual Feedback function. Fig 4-10 MOD current is determined by APC_FB. BIAS current is determined by APC_FF and APC_FB. The initial value of APC_FB according to the temperature can be set to accelerate power up time. 00 11 Prohibit 11 11 Prohibit RE_APC_FF_SET (Register or EEPROM) is composed of 2-bits. MSB shows BIAS (I-DAC2) and LSB shows MOD (I-DAC1), and "1" indicates APC Feed-forward function is selected. RE_APC_FB_SET (Register or EEPROM) is composed of 2-bits. MSB shows BIAS (I-DAC2) and LSB shows MOD (I-DAC2), and "1" indicates APC Feedback function is selected. Fig 4-4 APC example-1 (MOD=FF, BIAS=FB)
R_DAC1_FF I-DAC1 R_APC_FB 0 R_DAC1_FB =0 + R_DAC1 85/255 G_DAC1 Imod R_APC_FB 1 RE_DAC1_GAIN
Fig 4-5 APC example-2 (MOD=FB, BIAS=FF)
R_DAC1_FF = 0 R_DAC1_FB = R_APC_FB R_DAC1 RE_DAC1_GAIN I-DAC1 85/255 G_DAC1 Imod
+
I-DAC2 1 R_DAC2_FB = R_APC_FB + R_DAC2 54/255 G_DAC2 Ibias 0 R_DAC2_FB =0 + R_DAC2
I-DAC2 54/255 G_DAC2 Ibias
R_DAC1 = R_DAC1_FF R_DAC2 = R_DAC2_FB = R_APC_FB
R_DAC2_FF = 0
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5
R_DAC1 = R_DAC1_FB = R_APC_FB R_DAC2 = R_DAC2_FF
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5
Fig 4-6 APC example-3 (MOD=FF, BIAS=FF)
R_DAC1_FF I-DAC1 R_APC_FB 0 R_DAC1_FB =0 + R_DAC1 85/255 G_DAC1 Imod RE_DAC1_GAIN
I-DAC2 0 R_DAC2_FB =0 + R_DAC2 54/255 G_DAC2 Ibias
R_DAC1 = R_DAC1_FF R_DAC2 = R_DAC2_FF
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5

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2004/5
ASAHI KASEI Fig 4-7 APC example-4 (MOD=FF+FB, BIAS=FF)
R_DAC1_FF R_DAC1_FB = R_APC_FB I-DAC1 + R_DAC1 85/255 G_DAC1 Imod R_APC_FB 0 R_DAC1_FB =0 + R_DAC1 RE_DAC1_GAIN
[AK2573A] Fig 4-8 APC example-5 (MOD=FF, BIAS=FF+FB)
R_DAC1_FF I-DAC1 85/255 G_DAC1 Imod RE_DAC1_GAIN
R_APC_FB
1
I-DAC2 0 R_DAC2_FB =0 + R_DAC2 54/255 G_DAC2 Ibias 1 R_DAC2_FB = R_APC_FB + R_DAC2
I-DAC2 54/255 G_DAC2 Ibias
R_DAC1_FB = R_APC_FB R_DAC1 = R_DAC1_FF + R_DAC1_FB R_DAC2 = R_DAC2_FF
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5
R_DAC2_FB = R_APC_FB R_DAC1 = R_DAC1_FF R_DAC2 = R_DAC2_FF + R_DAC2_FB
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5
Fig 4-9 APC example-6 (MOD=FF+FB, BIAS=FB)
R_DAC1_FBRT (E_DAC_FBRT_FIX) R_DAC1_FF I-DAC1 R_APC_FB K_DAC1_ FBRT R_DAC1_FB + R_DAC1 85/255 G_DAC1 Imod RE_DAC1_GAIN
Fig 4-10 APC example-7 (MOD=FB, BIAS=FF+FB)
R_DAC1_FF = 0 R_APC_FB R_DAC1_FB = R_APC_FB R_DAC1 RE_DAC1_GAIN I-DAC1 85/255 G_DAC1 Imod
1
+
I-DAC2 1 R_DAC2_FB = R_APC_FB + R_DAC2 54/255 G_DAC2 Ibias
R_DAC2_FBRT (E_DAC_FBRT_FIX) K_DAC2_ FBRT R_DAC2_FB + R_DAC2
I-DAC2 54/255 G_DAC2 Ibias
R_DAC1_FB = K_DAC1_FBRT * R_APC_FB R_DAC2_FF = 0 R_DAC1 = R_DAC1_FF + R_DAC1_FB R_DAC2 = R_DAC2_FB = R_APC_FB
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5
R_DAC2_FB = K_DAC2_FBRT * R_APC_FB R_DAC1 = R_DAC1_FB = R_APC_FB R_DAC2 = R_DAC2_FF + R_DAC2_FB
R_DAC2_FF
RE_DAC2_GAIN G_DAC1/G_DAC2 = 1 or 0.5
Table 4-5 EEPROM Assignments for typical operation RE_APC_ RE_APC_ RE_APC_ E_DAC2_TC E_DAC1_TC I-DAC2 FF_SET FB_SET INIT_SET (BIAS) 01 10 0 E_DAC1_FF_TC FB 1 E_APC_INIT_TC E_DAC1_FF_TC FB 10 01 0 E_DAC2_FF_TC FF 1 E_DAC2_FF_TC E_APC_INIT_TC FF 11 00 x E_DAC2_FF_TC E_DAC1_FF_TC FF 11 01 x E_DAC2_FF_TC E_DAC1_FF_TC FF 11 10 x E_DAC2_FF_TC E_DAC1_FF_TC FF+FB 01 11 0 E_DAC1_FF_TC FB 01 11 1 E_APC_INIT_TC E_DAC1_FF_TC FB 10 11 0 E_DAC2_FF_TC FF+FB 10 11 1 E_DAC2_FF_TC E_APC_INIT_TC FF+FB 00 11 x Prohibit 11 11 x E_DAC1_FF_TC: I-DAC1 current data (temperature compensated) E_DAC2_FF_TC: I-DAC2 current data (temperature compensated) E_APC_INIT_TC: R_APC_FB initial data (temperature compensated) Table 4-6 APC FB Operation
RE_APC_ FB_SET 00 01 10 11 RE_APC_ FF_SET XX XX XX 00 01 10 11 K_DAC1_FBRT 0 1 0 R_DAC1_FBRT*1.25/64/G_DAC1 1 K_DAC2_FBRT 0 0 1 1 R_DAC2_FBRT/32/G_DAC2 Remark
I-DAC1 (MOD) FF FF FB FB FF FF+FB FF FF+FB FF+FB FB FB
No FB FB for MOD FB for BIAS Prohibit R_DAC1_FBRT=E_DAC_FBRT R_DAC2_FBRT=E_DAC_FBRT Prohibit

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2004/5
ASAHI KASEI Table 4-7 APC and EEPROM assignment (Self-running mode)
RE_APC_ RE_APC FB_SET _FF_SET 00 00 01 10 11 01 00 00 01 10 10 11 10 00 00 01 01 10 11 11 00 01 01 10 10 11 RE_APC_ INIT_SET X X X X 0 1 X 0 1 X 0 1 0 1 X X X 0 1 0 1 X R_DAC1_FF 0 E_DAC1_TC 0 E_DAC1_TC 0 0 E_DAC1_TC 0 0 E_DAC1_TC 0 0 E_DAC1_TC E_DAC1_TC 0 E_DAC1_TC E_DAC1_TC E_DAC1_TC 0 0 R_DAC2_FF 0 0 E_DAC2_TC E_DAC2_TC 0 0 0 E_DAC2_TC E_DAC2_TC E_DAC2_TC 0 0 0 0 E_DAC2_TC E_DAC2_TC 0 0 E_DAC2_TC E_DAC2_TC R_APC _FB 0 0 0 0 FB FB FB FB FB FB FB FB FB FB FB FB FB FB FB FB Initial setting R_APC_FB 0 0 0 0 0 E_DAC1_TC 0 0 E_DAC1_TC 0 0 E_DAC2_TC 0 E_DAC2_TC 0 0 0 E_DAC2_TC 0 E_DAC1_TC K_DAC1 _FBRT 0 0 0 0 1 1 1 1 1 1 0 0 0 0 0 0 See Table 4-6 See Table 4-6 1 1 K_DAC2_ FBRT 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 See Table 4-6 See Table 4-6 MOD (R_DAC1) 0 FF 0 FF FB FB FF + FB FB FB FF + FB 0 0 FF FF 0 FF FF + FB FF + FB FB FB BIAS (R_DAC2) 0 0 FF FF 0 0 0 FF FF FF FB FB FB FB FF + FB FF + FB FB FB FF + FB FF + FB E_DAC1 _TC FF FF FB_INIT FF FB_INIT FF FF FF FF FF FF FB_INIT E_DAC2 _TC FF FF FF FF FF FB_INIT FB_INIT FF FF FB_INIT FF FF -
[AK2573A]
Remarks
Prohibit
Prohibit
Table 4-8 APC and EEPROM assignment (Adjustment mode)
RE_APC_ FB_SET 00 01 10 11 RE_APC_ FF_SET XX XX XX 00 01 10 11 RE_APC_ INIT_SET X X X X X X X R_DAC1_FF I/F 0 I/F I/F 0 R_DAC2_FF I/F I/F 0 0 I/F R_APC_ FB 0 FB FB FB FB R_DAC1_ FBRT N/A N/A N/A I/F N/A R_DAC2_ FBRT N/A N/A N/A N/A I/F K_DAC1_ FBRT 0 1 0 See Table 4-6 1 K_DAC2_ FBRT 0 0 1 1 See Table 4-6 MOD (R_DAC1) FF FB FF FF + FB FB BIAS (R_DAC2) FF FF FB FB FF + FB Remarks
Prohibit
Prohibit

-19-
2004/5
ASAHI KASEI
[AK2573A]
4.3 Temperature Sensor (TEMPSENS) Fig 4-11 shows an on-chip temperature sensor characteristics and Table 4-9 shows the relationship between detected temperature and ADC code. Fig 4-11 On-chip Temperature Sensor Characteristics
On-chip Temperature sensor characteristics 2.5
2.0 Output voltage V [V]
1.5
1.0
0.5
0.0 -40 -20 0 20 40 60 80 100 120 Temperature t [C]
(1) (2) (3) (4)
Slope: -11.56mV/ (typ) V(t) = -0.01156 * t + 1.62 [V] (typ) AD_code = int( V(t) / 2.2 * 127 +0.5) = int(-0.667*t + 94.0) Temperature step @ AD_code=1LSB: 1.49/LSB
* Temperature sensor detects the junction temperature, not LD or ambient temperature.

-20-
2004/5
ASAHI KASEI Table 4-9 AD code and detected temperature [typ] AD code AD code Temp [] Temp [] 0 140.1 32 92.2 1 138.6 33 90.7 2 137.1 34 89.2 3 135.6 35 87.7 4 134.1 36 86.2 5 132.6 37 84.7 6 131.1 38 83.2 7 129.6 39 81.7 8 128.2 40 80.2 9 126.7 41 78.7 10 125.2 42 77.2 11 123.7 43 75.7 12 122.2 44 74.2 13 120.7 45 72.7 14 119.2 46 71.2 15 117.7 47 69.7 16 116.2 48 68.2 17 114.7 49 66.7 18 113.2 50 65.2 19 111.7 51 63.7 20 110.2 52 62.2 21 108.7 53 60.7 22 107.2 54 59.2 23 105.7 55 57.7 24 104.2 56 56.2 25 102.7 57 54.7 26 101.2 58 53.2 27 99.7 59 51.7 28 98.2 60 50.2 29 96.7 61 48.7 30 95.2 62 47.2 31 93.7 63 45.7
[AK2573A]
AD code 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95
Temp [] 44.2 42.7 41.2 39.7 38.2 36.7 35.2 33.7 32.2 30.7 29.2 27.7 26.3 24.8 23.3 21.8 20.3 18.8 17.3 15.8 14.3 12.8 11.3 9.8 8.3 6.8 5.3 3.8 2.3 0.8 -0.7 -2.2
AD code 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127
Temp [] -3.7 -5.2 -6.7 -8.2 -9.7 -11.2 -12.7 -14.2 -15.7 -17.2 -18.7 -20.2 -21.7 -23.2 -24.7 -26.2 -27.7 -29.2 -30.7 -32.2 -33.7 -35.2 -36.7 -38.2 -39.7 -41.2 -42.7 -44.2 -45.7 -47.2 -48.7 -50.2
4.4 Current Monitor AK2573A has MOD current and BIAS current monitor, MODMON and BIASMON respectively. MODMON is 0.0095 times of I-DAC1 output (source type) and BIASMON is 0.0095 times of I -DAC2 output (source type).

-21-
2004/5
ASAHI KASEI 5. Alarm AK2573A has 5 alarm functions as shown in Table 5-1. Table 5-1 Alarm function ALM Detection condition OPTALM When monitor PD current is below the OPTALM level. CURRALM When R_DAC1 or R_DAC2 is beyond CURRALM level or equal to full code. TEMPALM When the detected temperature is beyond TEMPALM level. DATAALM When the detected 0s or 1s sequential data input (4.5us typical). TXFAULT When one or more alarm detected. Note 1: Not include delay time by RPD and CPD.
[AK2573A]
Polarity Detected Time Programmable 5us (typ) (Note 1) Programmable every 125us (typ) Programmable every 128ms (typ) Programmable 4.5us (typ) "H" depends on detected ALM
5.1 OPTALM OPTALM level (optalm_ref) is selectable among 1/3, 1/4, 1/6 and 1/7 of APC FB reference voltage (vapc_ref) by RE_OPTALM. OPTALM is detected when vpd < optalm_ref. APC FB keeps R_APC_FB during OPTALM detection in the"Self running mode". 5.2 CURRALM CURRALM is detected when R_DAC1(MSB 4bit) > R_CURRALM_DAC1 or R_DAC2(MSB 4bit) > R_CURRALM_DAC2 R_CURRALM_DAC1 and 2 can be set every 6. CURRALM is clear when receiving disable request (TX_DIS1 or TX_DIS2 is set "H"). 5.3 TEMPALM TEMPALM is detected when R_TEMP < R_TEMPALM. R_TEMP has negative slope compared to the temperature, TEMPALM is detected when the detected temperature beyond R_TEMPALM. 5.4 DATAALM DATAALM is detected when input DATA is 0's or 1's fixed more than 4.5us (typ). APC FB keeps R_APC_FB during DATAALM detection in the"Self running mode". DATAALM detection is ignored when RE_DATAALM_MASK= "1". 5.5 TXFAULT TXFAULT function is shown in Table 5 -2. Table 5-2 TXFAULT RE_SFP Shutdown request (TXDIS 1, 2) 0 0 0 0 0 1 1 0 1 0 1 1
ORed ALM 0 1 X 0 1 X
TXFAULT 0 1 ORed ALM 0 1 (Hold) 0 or 1 (Hold)
I-DAC output Normal Operation Normal Operation Shutdown Normal Operation Shutdown Shutdown

-22-
2004/5
ASAHI KASEI RE_SFP = 0 operation Set "H" when OPTALM, CURRALM, TEMPALM or DATAALM is detected Set "L" when no ALM detected.
[AK2573A]
RE_SFP=1 operation Support TX_FAULT of the SFP (Small Form-factor Pluggable) requirement. Set and hold "H" when detected OPTALM, CURRALM, TEMPALM or DATAALM and go into shutdown mode. Reset to "L" when TXDIS1 or TXDIS2 is "H" "L". Refer to "6. Shutdown" for more information. During "Adjustment mode", TXFAULT detection is ignored. 6. Shutdown 6.1 Shutdown Operation Fig 6-1 shows the shutdown operation. The AK2573A supports the SFP (Small Form-factor Pluggable) requirement. Fig 6-1 Shutdown Operation TXDIS1 TXDIS2 1 X X 1 0 0 0 0 0 0 RE_SFP X X 0 1 1 TXFAULT X X X 0 1 Operation Shutdown Shutdown Normal Operation Normal Operation Shutdown Remarks Shutdown with pin Shutdown with pin
SFP TXFAULT Operation
Fig 6-2 Shutdown Condition Function Operation I-DAC1 / 2 output High-Z (0mA output) APC_FF Normal Operation. APC_FB Keep the data at shutdown request. ALM Normal Operation TXFAULT R_SFP=0: Normal Operation R_SFP=1: Keep the data at shutdown request.
Remarks
6.2 Temperature Comparison between Shutdown Request and Release The AK2573A keeps the temperature data at shutdown request and compares it with temperature at release request to avoid over-current conditions at the LD. When the AK2573A detects a temperature difference between at shutdown request and the release request, the APC FB data is set to 0 or to initial values in response to the temperature at the release request. The temperaturedifference is programmable. When the AK2573A does not detect a temperature difference,it keeps the APC FB data, resulting in faster operation. This function works at release request as follows: if (ABS(R_TEMP_STDW - R_TEMP)) > R_TEMP_WIN) R_APC_FB = 0 or reset to the initial value in response to the R_TEMP where, R_TEMP_STDW is a temperature at shutdown request R_TEMP is a temperature at release request R_TEMP_WIN is a temperature difference (user programmable) APC FF continues to operate during shutdown for fast performance when a release request is received. However, the I-DAC current stays at 0mA.

-23-
2004/5
ASAHI KASEI Table 6-3 Operation at shutdown release RE_SFP TXFAULT at RE_TEMP_ Temp Difference Shutdown request DET result 0 X 0 X 0 X 1 0 0 X 1 1 1 0 0 X 1 0 1 0 1 0 1 1 1 1 X X
[AK2573A]
R_APC_FB Initial value Hold data Initial value Initial value Hold data Initial value Initial value
Remark
7. Power-up / down Timing 7.1 Delay Time of TXFAULT Detection with OPTALM In correspond to the delay time caused by RPD and CPD to get the moniter PD average current, the delay time of TXFAULT detection with OPTALM is set when RE_SFP="1" (SFP support). AK2573A has 2 delay time when RE_SFP="1": normal delay and accelerated delay. Accelerated delay may be selected when both I-DAC1 and I-DAC2 are set to APC_FF or APC_FB with an initial value setting. Table 7-1 shows the delay time of TXFAULT detection with OPTALM and Fig 7-1 illustrated block diagram. Note: When accelerated delay is selected with RE_SFP="1", APC_FF data or initial data of APC_FB should be suitable, otherwise AK2573A might go into shutdown by detection of OPTALM after delay time. Fig 7-1 APC_FB Block Diagram
APC Feedback (R_APC_FB)
LD
Monitor PD PDIN CPD RPD
PDGAIN (R_PDGAIN)
APC_ COMP
Digital Filter
PDGAIN
vpd OPTALM Level (R_OPTALM)
TX_FAULT Control
Detection and reset OPTALM vary with the cut-off frequency of CPD and RPD
APC Terget (R_APC_TRGT )
DAC_APC
vapc_ref
ATT
OPTALM OPTALM reference (opalm_ref)
Table 7-1 Delay time of TXFAULT detection with OPTALM RE_SFP R_TIMER_ R_APC_ R_APC_ Delay Time of TXFAULT Remarks OPTALM INIT_SET FF_SET detection with OPTALM 0 X X X 0 ms disable TXFAULT detection 1 0 X X 160 ms (typ) 1 1 0 00 160 ms (typ) 01 10 1 1 X 11 2 ms (typ) Acceleration power-up 1 1 1 X 2 ms (typ)

-24-
2004/5
ASAHI KASEI 7.2 Power on Initialization Procedure without Shutdown Request (TXDIS=L)
VDD
[AK2573A]
TXDIS
2ms LD Current APC FF or FB initial setting APC FF
TXFAULT with OPTALM enable (if accelerated delay time is selected)
Normal Operation
APC FB initial procedure ALM operation Power On Reset TXFAULT enable without OPTALM) TXFAULT with OPTALM enable
t_init: 160ms (typ)
7.3 Power on Initialization Procedure with Shutdown request (TXDIS=H)
VDD
TXDIS 2ms
TXFAULT with OPTALM enable (if accelerated delay time is selected)
LD current
APC FF or FB initial setting APC FF
APC FB initial procedure
Normal Operation
Power On Reset
ALM operation TXFAULT enable without OPTALM) TXFAULT with OPTALM enable
t_init: 160ms (typ)

-25-
2004/5
ASAHI KASEI 7.4 TXDIS Timing during Normal Operation
VDD 10us (min) TXDIS
[AK2573A]
TXFAULT TXFAULT enable (without OPTALM) TXFAULT disable LD current 2ms t_off: 10us (max) t_on: 1ms (max) TXFAULT enable (+ OPTALM)
Temperature gap detection Normal Initialize Procedure: 160ms (typ) Acceleration Procedure: 1ms (max)
7.5 TXFAULT Detection / Reset with Recovery
VDD
TXDIS FAULT
t_reset: 10us (min)
TXFAULT Acceleration selected LD current
Depends on detected ALM (see Table 5-1)
APC Feedback Power-up Sequence t_init: 160ms (max)

-26-
2004/5
ASAHI KASEI 7.6 TXFAULT Detection / Reset without Recovery
VDD
[AK2573A]
TXDIS
t_reset: 10us (min)
FAULT
TXFAULT
LD current
Depends on detected ALM (see Table 5-1)
t_fault TX_FAULT with OPTALM Accelerated delay time is selected: 2ms (typ) Normal delay time is sekected: 160ms (typ)

-27-
2004/5
ASAHI KASEI
[AK2573A]
8. I2CTM I/F 8.1 Memory Map Table 8-1 shows the EEPROM / Register address map. Accessto memory (EEPROM / registers) is done via the I2CTM I/F format. WP (Write Protect) may limit the access of memory as shown in Table 8-2. Table 8-1 Memory map Device Address Device Address-1 A0h 1010 A0h A2h A4h A6h A6h A8h A8h A8h 1010 1010 1010 1010 1010 1010 1010 1010 Device Address-2 000 000 001 010 011 011 100 100 100 Address 00000000 to 01111111 10000000 to 11111111 00000000 to 11111111 00000000 to 11111111 00000000 to 01111111 10000000 to 11111111 00000000 to 00011001 00011010 to 11111110 11111111 Data User Area (EEPROM, 1kbit) No memory No memory Adjustment data (EEPROM, 3kbit) No memory Registers No memory AK2573A Operation mode change
Table 8-2 Memory access limitation with WP Item WP = "L" Device Address 1010xxx ACK (Note 1) when receive device address EEPROM / Register Full access Access Operating mode Full Page Write 16 byte (without registers) Sequential Read from 00000000000 to 01111111111 Registers Access Random access only Note 1) During EEPROM Write operation, no ACK is generated.
WP = "H" 1010000 when receive device address User area only (read only) Self runnig mode only from 00000000 to 01111111 -

-28-
2004/5
ASAHI KASEI 8.2 Read/Write Operation 8.2.1 Byte Write
[AK2573A]
SDA
S T A R T
1010
Device Address-1
00
Device R/ Address-2 W A C K Address (MSB First)
0
A C K Data (MSB First)
0
A C K S T O P
8.2.2 Page Write AK2573A is capable of 16-byte page write.
SDA
S T A R T
1010
Device Address-1
00
R/ Device Address-2 W A C K Address (MSB First)
0
A C K Data (Address)
0
A C K Data (Address + 1)
0
A C K
....
0
A C K Data (Address + n)
0
AS CT KO P
8.2.3 Current Address Read The internal address counter maintains the last address accessed during the last read or write operation, incremented by one. The roll over address is changed WP setting. Refer to Table 7-2 in detail.
SDA
S T A R T
1010
Device Address-1
10
Device R/ Address-2 W A C K Data (MSB First)
1
N O A C K S T O P
8.2.4 Random Read A random read requires a "dummy" byte write sequence to specified "Address". After receive the ACK from AK2573A, perform "current address read" (see 8.2.2).
SDA
S T A R T
1010
Device Address-1
00
Device R/ Address-2 W A C K
*1
Address (MSB First)
0
AS CT KA R T
1010
Device Address-1
10
Device R/ A Address-2 W C K Data (MSB First)
1
NS OT AO CP K
Dummy Write
*1: Don't care when WP="H"
8.2.5 Sequential Read Sequential read can be initiated as ether"Current Address Read" or "Random Read". After issuing either of them, the AK2573A continues to output data for each ACK received.
SDA
....
10
Device R/ A Address-2 W C K Data-1 (MSB First)
0
A C K Data-2
0
A C K
....
0
A C K Data-n
1
NS OT AO CP K

-29-
2004/5
ASAHI KASEI
[AK2573A]
8.2.6 Data Change The SDA pin is normally pulled high with 4.7k to 10k. Data on the SDA pin may change only during SCL low time period. Data changes during SCL high periods will indicate a start or stop condition.
SCL
SDA
Data Stable Data Change
8.2.7 Start / Stop Condition Start Condition: A high-to-low transition of SDA with SCL high is a start condition that must precede any other command. Stop Condition: A high-to-low transition of SDA with SCL high is a stop condition.
SCL
SDA
START STOP

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2004/5
ASAHI KASEI 8.3 EEPROM EEPROM memory map is shown in Table 8-3, 8-4 and 8-5. EEPROM access islimited with WP pin and Operation mode (refer to Table 9-1, for more information). WP = "L": Full access WP = "H": User area only with read only
[AK2573A]
(Note) The AKM factory adjusted data are stored in advance at address (Device Address2 = 011, Address=60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to this device which exceeds a guaranteed EEPROM data retention conditions ( for 10 years at 85), it is important to read the pre-determined value in advance and to re-write the same data back into EEPROM after an exposure to the excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to re-write it after the tests. Table 8-3 EEPROM Address MAP Device Address DATA (D7-D0) Address A0h 00h (0) User Area (1kbit) 7Fh (127) A0h 80h (128) No Memory FFh (255) A2h 00h (0) FFh (255) A4h 00 h(0) E_DAC1_TC Temperature data for I-DAC1 (1kbit) 7F h(127) A4h 80h (128) E_DAC2_TC Temperature data for I-DAC2 (1kbit) FFh (255) A6h 00h (0) E_DUTY_TC (5bit) Temperature data for Duty Adjustment (256bit) 1Fh(31) A6h 20h (32) E_APC_TRGT_TC (5bit) Temperature data for APC FB reference (R_APC_TARGT) (256bit) 3Fh (63) A6h 40h (64) MSB 4bit: E_CURRALM_DAC1_TC LSB 4bit: E_CURRALM_DAC2_TC Temperature data for CURRALM 5Fh (95) (256bit) A6h 60h (96) Adjustment data (256bit) 7Fh (255)
Initial Value 00h
Remark
00h
Addressing with R_TEMP (1.5 step) Addressing with R_TEMP (1.5 step) Addressing with MSB 5bit of R_TEMP (6 step) Addressing with MSB 5bit of R_TEMP (6 step) Addressing with MSB 5bit of R_TEMP (6 step)
00h
00h
00h
FFh
see Table 8-4 and 8-5

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ASAHI KASEI Table 8-4 Adjustment Data Area (Device Address-2 = 011) Address EEPROM Function E_VRFTRIM[7:4] 60h Oscillator Frequency E_TEMP_OFFSET[3:0] 60h Temperature sensor offset E_APC_FF_SET[7:6] 61h APC FF Setting E_APC_FB_SET[5:4] 61h APC FB Setting E_APC_INIT_SET[3] 61h APC FB Initial Setting E_SFP[2] E_DAC1_GAIN[1] E_DAC2_GAIN[0] E_TEMP_DET[5] E_TIMER_OPTALM[4] E_ALM_POL[3] E_OPTALM[1:0] E_TEMP_WIN[6:0] E_DAC_FBRT_FIX[6:0] 61h 61h 61h 62h 62h 62h 62h 63h 65h SFP Setting I-DAC1 Gain I-DAC2 Gain
[AK2573A]
Bit 4 4 2 2 1 1 1 1
Temperature compensation 1 at shutdown release ON/OFF Delay time of TXFAULT 1 detection with OPTALM ALM Polarity 1 OPTALM Reference Level 2
E_DATAALM_MASK[0] 67h E_PDGAIN[5:0] E_TEMPALM[6:0] 68h 6Ch
Temperature Difference 7 Detection Level APC FB Dual Feedback 7 Ratio DATAALM mask 1 PDGAIN TEMPALM Level 6 7
Initial Value Remark Factory Setting Factory Setting 00 see Table 4-4 00 see Table 4-4 0 0: No Initial Setting 1: Initial Setting 0 0: No SFP Support 1: SFP Support 0 0: Gain = 1/2 1: Gain = 1 0 0: Gain = 1/2 1: Gain = 1 1 0: OFF 1: ON 0 0: 160ms 1: 2ms 0 0: "H" 1: "L" 00 00: 1/3, 01: 1/4 10: 1/6, 11: 1/7 00h see section 6.2 00h 0 00h 00h see section 4.3 0: DATAALM Valid 1: DATAALM Invalid see Table 4-2 see Table 4-9
Table 8-5 EEPROM Map (Adjustment Data Area) Address D7 D6 D5 D4 60h VREFTRIM 61h APC_FF_SET APC_FB_SET 62h 63h 64h 65h 66h 67h 68h 69h 6Ah 6Bh 6Ch 6Dh - 7Fh TEMP_ DET
D3
APC_ INIT_SET TIMER_ ALM_ OPTALM POL TEMP_WIN DAC_FBRT_FIX
D2 D1 D0 TEMP_OFFSET SFP DAC1_ DAC2_ GAIN GAIN OPTALM
DATAALM_ MASK PDGAIN
TEMPALM Reserved (for AKM Test)

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ASAHI KASEI
[AK2573A]
8.4 Register Register memory map is shown in Table 8-6 and 8-7. Register access is limited with WP pin and Operation mode (refer to Fig 9-1, for more information). Table 8-6 Register (Device Address = A8h) Address Register Function R_VRFTRIM[7:4] 00h Oscillator Frequency R_TEMP_OFFSET[3:0] 00h Temperature sensor offset R_APC_FF_SET[7:6] 01h APC FF Setting R_APC_FB_SET[5:4] 01h APC FB Setting R_APC_INIT_SET[3] 01h APC FB Initial Setting R_SFP[2] R_DAC1_GAIN[1] R_DAC2_GAIN[0] R_TEMP_DET[5] R_TIMER_OPTALM[4] R_ALM_POL[3] R_OPTALM[1:0] R_TEMP_WIN[6:0] R_DAC1_FBRT[6:0] R_DATAALM_MASK[0] R_DAC2_FBRT[6:0] R_PDGAIN[5:0] R_TEMPALM[6:0] R_TEMP[6:0] R_TEMP_STDW[6:0] R_DAC1_FF[7:0] R_DAC2_FF[7:0] R_APC_FB[8:0] R_DAC1_FB[8:0] R_DAC2_FB[8:0] R_DAC1[7:0] R_DAC2[7:0] R_APC_TRGT[4:0] R_CURRALM_DAC1[7:4] R_CURRALM_DAC2[3:0] R_DUTY[4:0] AKM Test 01h 01h 01h 02h 02h 02h 02h 03h 05h 06h 07h 08h 09h 0Ah 0Bh MSA(SFP) Setting I-DAC1 Gain I-DAC2 Gain Bit 4 4 2 2 1 1 1 1 Type U U U U U U U U U U U U U U U U U U U U U U S S S U U U U U U R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W Remark
Temperature compensation 1 at shutdown release ON/OFF Delay time of TXFAULT 1 detection with OPTALM ALM Polarity 1 OPTALM Reference Level Temperature Difference Detection Level APC FB Ratio for I-DAC1 DATAALM Mask APC FB Ratio for I-DAC2 PDGAIN TEMPALM Level Detected Temperature Temperature at Shutdown request I-DAC1 FF I-DAC2 FF APC FB I-DAC1 FB I-DAC2 FB I-DAC1 I-DAC2 APC Reference CURRALM for I-DAC1 CURRALM for I-DAC2 Duty Adjust Test for AKM 2 7 7 1 7 6 7 7 7
see Table 4-4 see Table 4-4 0: No initial Setting 1: Initial Setting 0: No SFP Support 1: SFP Support 0: Gain = 1/2 1: Gain = 1 0: Gain = 1/2 1: Gain = 1 0: OFF 1: ON 0: 160ms 1: 2ms 0: "H" 1: "L" 00: 1/3, 01: 1/4 10: 1/6, 11: 1/7 see section 6.2
see section 4.3 0: DATAALM Valid 1: DATAALM Invalid R/W see section 4.3 R/W see Table 4-2 R/W see Table 4-9 R/(W) see Table 4-9 R/(W) see section 6.2 R/W R/W R/(W) R/(W) R/(W) R/(W) R/(W) R/W R/W R/W R/W Note 2 Note 3 Note 1 Note 1 Note 1 Note 2 Note 3 see Table 4-3 see section 5.2 see section 5.2
0Ch 8 0Dh 8 0Eh 9 11h 9 12h 9 13h 8 14h 8 15h 5 16h 4 16h 4 17h 5 18h1Dh 2 Note 1: The data format of read / write via ICTM (8bit) is shown in Fig 8-1. Note 2: R_DAC1 = R_DAC1_FF + R_DAC1_FB, R_DAC1>=0, Note 3: R_DAC2 = R_DAC2_FF + R_DAC2_FB, R_DAC2 >= 0

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ASAHI KASEI
[AK2573A]
Note 4: (1) R/W R: Read Only. R/(W): Read / Write, Write data may be changed by internal operation. R/W: Read/Write, Write data is hold unless re-writing or operation mode changing. All adjustment would be done by R/W registers. (2) Data Type U: Unsigned, S: Signed (2's Complement) Table 8-7 Register Map Address D7 D6 D5 D4 00h VREFTRIM 01h APC_FF_SET APC_FB_SET 02h 03h 04h 05h 06h 07h 08h 09h 0Ah 0Bh 0Ch 0Dh 0Eh 0Fh 10h 11h 12h 13h 14h 15h 16h 17h 18h 1Dh TEMP_ DET D3 D2 D1 D0 TEMP_OFFSET SFP DAC1_ DAC2_ GAIN GAIN OPTALM
APC_ INIT_SET TIMER_ ALM_ OPTALM POL TEMP_WIN DAC1_FBRT
DATAALM_ MASK DAC2_FBRT PDGAIN TEMPALM TEMP TEMP_STDW DAC1_FF DAC2_FF APC_FB (see Fig 8-1)
DAC1_FB DAC2_FB DAC1 DAC2 CURRALM_DAC1 APC_TRGT CURRALM_DAC2 DUTY Reserved (for AKM test)

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ASAHI KASEI Fig 8-1 The data format of signed 9 bit register
Register (9bit 2's complement) Body (8bit) D7 D6 D5 D4 D3 D2 D1 D0
[AK2573A]
Sign D8
Read Data via Digital I/F (8 bit) (Sign + Body (MSB 7bit) Write Data via Digital I/F (8 bit) (Body 8bit, Negative Data can not be written)
9. Operation Mode The AK2573A has 3 operating modes: Self-running, Adjustment and EEPROM mode. 9.1 Self-running Mode Self-running mode is ready for normal operation after all adjustments are completed. In this mode, temperature detection, EEPROM access and feeding current are automatically performed using the on-chip oscillator. The AK2573A works in this mode after power-on. 9.2 Adjustment Mode Adjustment mode is designed for training the LD characteristics. The AK2573A operates according to the register settings set through the I2CTM I/F. During adjustment mode, R_SFP should be 0. 9.3 EEPROM Mode EEPROM mode is used for storing LD characteristics into EEPROM. 9.4 MODE Control The AK2573A operation modes are changed through the I2CTM interface. Table 9-1 shows the access limitation of each operation mode and Table 9-2 shows the command to change operation mode. Note: The I2CTM interface access is prohibited for 1ms after power-on or mode transfer to self-running mode. Table 9-1 Access limitation of each operation mode EEPROM Access Operation mode Read Write Self-running mode x (WP="L") Adjustment mode x (WP="L") EEPROM mode (WP="L") WP = "H" x Self-running mode only (User Area Only) Table 9-2 Operation mode change Device Address R/W 1010100 W 1010100 W 1010100 W Address 11111111 11111111 11111111 Data 10100000 10100111 10101110 Register Access Write x (except mode-change command) x (except mode-change command) x
Read x
Operation mode Self-running mode Adjustment mode EEPROM mode
9.5 Operation Mode Protection When set WP = "H", only self-running mode is selected.

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ASAHI KASEI 10. Module Adjustment Example Table 10-1 shows the module adjustment example.
[AK2573A]
Table 10-1 Module Adjustment Example No. Item Contents 1 Go to Adjustment mode Issues "Changing to Adjustment mode command" (see Table 9-2) via I2CTM I/F. 2 SFP setting Set R_SFP = 0 to avoid TXFAULT detection at adjustment mode. 3 APC setting Set R_APC_FB_SET = "00" and R_APC_FF=11. BIAS and MOD current is set as "Open Loop". 4 LD current adjustment Set R_DAC1_GAIN and R_DAC2_GAIN, then adjust R_APC_FF_DAC1 for modulation current and R_APC_FF_DAC2 for BIAS current of LD. 5 Duty adjustment Adjust R_DUTY for 50% duty of LD power, if necessary. After duty adjustment, tune MOD and BIAS current by R_APC_FF_DAC1 and 2, if necessary. 6-A PDGAIN adjustment Adjust R_PDGAIN for PDMON = 1V. Go to step -7. If you cannot measure PDMON voltage, see step 6 -B. 6-B PDGAIN adjustment Set R_APC_TRGT=100000 and R_PDGAIN=000000 (Gain=23.5dB). Then set R_APC_FF_SET and R_APC_FB_SET as your configulation. APC FB adjusts LD output automatically. Adjust R_PDGAIN for normal LD output. R_APC_TRGT adjustment is for fine tunning of optical power. Go to step-8. 7 APC FB setting Set R_APC_TRGT = "10000". Set R_APC_FB_SET according to your configuration. 8 APC FB target Adjust R_APC_TRGT to tunning LD output. LD output is adjusted adjustment automaticaaly according to the R_APC_TRGT. 9 Read temperature data Read R_TEMP (on-chip temperature sensor detection temperature). 10 Estimate LD temperature (1) 2 or more temperature adjustment characteristics Do step 2 to 8 with different temperature and estimate LD current data of look-up table. (2) Single point adjustment Calculate LD current data of look-up table with on-chip temperature sensor gain (-1.49/LSB), R_TEMP and LD characteristics. Write adjustment data to (1) Make the data for EEPROM. EEPROM (2) Issue mode change command to EEPROM. (3) Write adjustment data to EEPROM. (4) Read EEPROM data and verify it. Self running mode Issue mode change command to self-running. AK2573A operates temperature detection, feed current in response to temperature, and a feedback operation automatically according to the data in EEPROM.
11
12

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ASAHI KASEI . Circuit Example Fig-A illustrates circuit example of AK2573A. Fig-A Circuit Example
C11 C12 C13 C14 LD L1 CPD C20 VSSMD IMODN IMODN VSSMD VSSBI IBIAS VSSBI AVDD IMOD IMOD IBIAS PDIN C19 C1 AVSS R2 R1 VCC = 3.3V +/- 0.2V PD RPD
[AK2573A]
L1: Ferrite Bead (Murata BLM18BD102) fpd = 1/ (2**RPD*CPD) = 1kHz10kHz R1 = 10 +/- 1% R2 = 12k +/- 1% R3 = R4 = R5 = R6 = 4.7k10k C1 = 1uF C12=C14=C16=C18=C20 = 0.01uF or 0.001uF C11=C13=C15=C17=C19 = 0.1uF
VDDMD NC C17 C18 VDDDR VSSDR
PDMON BIAS TEMPMON
BIASMON MODMON TEST1 TEST2 TEST3 TEST4
AK2573AVB
TEMPALM CURRALM OPTALM DATAALM NC DVSS
Mod_def 1
R3
TXDIS1
DATAP
CLKP
CLKN
DVDD
Open
DATAN
TXDIS2
TXFAULT
TEST5 TEST6 NC SEL WP
SCL SDA NC Mod_def 2 R4
Tx_Fault LVPECL I/F (see below) C15 C16
R5
For full access: GND For write protection: Open or VDD
VCC or GND Normal Operation with Open: Pull-down Shutdown Operation with Open: Pull-up R6 Tx_Disable
LVPECL I/F
DATA Only AC Coupling TD + C101 R101 C102 DATAN SEL CLKP VDD or Open CLKN VDD or Open R113 TD R114 DATAP DATA Only DC Coupling R111 TD + R112 TD R124 R125 CLK + R126 CLKP DATA & CLK DC Coupling DATAP TD + R122 R121 DATAP R123 DATAN SEL CLKP CLKN
TD -
DATAN SEL
R101 = 100 C101 = C102 >= 0.01uF
R111 = R113 = 130 R112 = R114 = 82
R127 CLK R128
CLKN R121 = R123 = R125 = R127 = 130 R122 = R124 = R126 = R128 = 82

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ASAHI KASEI
[AK2573A]
IMPORTANT NOTICE * These products and their specifications are subject to change without notice. Before considering any use or application, consult the Asahi Kasei Microsystems Co., Ltd. (AKM) sales office or authorized distributor concerning their current status. * AKM assumes no liability for infringement of any patent, intellectual property, or other right in the application or use of any information contained herein. * Any export of these products, or devices or systems containing them, may require an export license or other official approval under the law and regulations of the country of export pertaining to customs and tariffs, currency exchange, or strategic materials. * AKM products are neither intended nor authorized for use as critical components in any safety, life support, or other hazard related device or system, and AKM assumes no responsibility relating to any such use, except with the express written consent of the Representative Director of AKM. As used here: (a) A hazard related device or system is one designed or intended for life support or maintenance of safety or for applications in medicine, aerospace, nuclear energy, or other fields, in which its failure to function or perform may reasonably be expected to result in loss of life or in significant injury or damage to person or property. (b) A critical component is one whose failure to function or perform may reasonably be expected to result, whether directly or indirectly, in the loss of the safety or effectiveness of the device or system containing it, and which must therefore meet very high standards of performance and reliability. * It is the responsibility of the buyer or distributor of an AKM product who distributes, disposes of, or otherwise places the product with a third party to notify that party in advance of the above content and conditions, and the buyer or distributor agrees to assume any and all responsibility and liability for and hold AKM harmless from any and all claims arising from the use of said product in the absence of such notification.

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2004/5


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